Year : 2012
Number of Pages: 36 leaves
Adviser : Prof. Glen A. Imbang
Executive Summary
The MEMS
assembly yield output of Company X has been steadily increasing, although the
performance has been short of the 99.5 percent minimum assembly yield output of
the company's other products. The time it takes to for the yield to reach 99.5
percent is projected given its steady growth. The defects reduction trend in
the different process stations were analyzed based on impact and the best trend
line model, which translated on how these would be helpful in projecting
improvements. However, the quantitative method approach of Trend Analysis might
not be completely reliable and that specific actions should be laid out. Each
process defect trend was subjected to a learning curve analysis and interpreted
for how further defect reduction can be obtained. Further application of
learning curve leads to analysis of learning spillovers that could possibly
increase the rate of cost reduction. However, management should decide if the
company will be willing to exchange the proprietary reduction for this decrease
in cost. An Operation system model for process improvement, based on Trend
Analysis and Learning Curve, has been created in order to provide a quick
snapshot for management on how future process improvement projects should be
generated. The decision to weigh on the investment against the gains relies on
the company's management team. Management should continue to capitalize on the
high improvement gains on Seal, Wirebond, Particle and Die Attach, but the
application of improvement projects may need to be reviewed as the gains on
some of the station have started to level off. More focus needs to be given to
Die Preparation.
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